Typo, that's DFT (design for test)

来源: 2006-11-05 11:49:35 [旧帖] [给我悄悄话] 本文已被阅读:

They are the bridge point between test and design, they come up with logic and method to check the digital logic inside the chip via BIST Built In Self Test or Scan via verilog verification. Then Test takes DFT's metrologies and implements them on ATE (Automated Test Equipment) for production test.